Product Details
Zeiss scanning electron microscopeEVO series
The modular SEM platform is suitable for intuitive operation, routine testing, and research applications
The EVO series combines high-performance scanning electron microscopy with an intuitive and user-friendly interface experience, while also attracting experienced and new users. Whether in the fields of life sciences, materials science, or routine industrial quality assurance and failure analysis, EVO can be tailored to your requirements with a wide range of optional configurations.
Multi functional solutions for microscope centers or industrial quality assurance laboratories
Different vacuum chamber sizes and stage options to meet all application requirements - even for large industrial component samples
Using LaB6 filament can achieve excellent image quality
Excellent imaging and analysis performance for samples with non-conductive and non-conductive coatings
Multiple analysis detectors can be configured to meet the needs of various microscopic analysis applications
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SmartSEM Touch allows interactive workflow control with your fingertips. It is simple and easy to learn, greatly reducing the effort and cost of training, and even new users can capture stunning images in just a few minutes. This user interface also supports industrial operators who require automated workflows to perform repeatable inspection tasks. |
![]() Excellent image quality
EVO excels at obtaining high-quality data on untreated and non-conductive coated samples. EVO also allows samples to retain their original state, maintaining the data quality of water containing and heavily contaminated samples. In addition, when imaging and microanalysis face challenges, using LaB6 filament can provide better resolution, contrast, and signal-to-noise ratio.
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![]() EVO can be associated with other devices
EVO can be used as part of a semi-automatic, multi-mode workflow to achieve information integrity by repositioning areas of interest and collecting data in multiple ways. Combine optical and electron microscope images for material characterization or part inspection, or associate EVO with Zeiss optical microscope for particle size analysis. |
EVO series
Vacuum chamber size selection
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Zeiss EVO 10 |
Zeiss EVO 15 |
Zeiss EVO 25 |
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Choosing EVO 10 (optional with BSD and EDS) is the entry point for you to purchase a scanning electron microscope at a very affordable price. Even though this EVO vacuum chamber is small, it is different from a desktop electron microscope. Your investment in EVO now ensures that you are ready for future applications that require more space and ports.
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The EVO 15 fully demonstrates the flexibility concept of the EVO family and excels in analytical applications. By choosing the larger vacuum chamber of EVO 15 and adding a variable pressure mode for imaging and analysis of non-conductive samples or parts, you will have a multifunctional and versatile microscope equipment or industrial quality assurance laboratory solution. |
EVO25 is the main solution for industry, with enough space to accommodate even larger components and assemblies. The optional 80 mm Z-axis travel stage can further expand the functionality of EVO 25, which can handle samples weighing up to 2 kilograms or even tilt. In addition, the large vacuum chamber will be able to accommodate multiple analytical detectors to meet the demanding requirements of microanalysis applications. |
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| Maximum sample height |
100 mm |
145 mm |
210 mm |
| Maximum sample diameter |
230 mm |
250 mm |
300 mm |
| Electric stage travel XYZ |
80 x 100 x 35 mm
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125 x 125 x 50 mm |
130 x 130 x 50 (or 80) mm |
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High Vacuum Mode (HV) Imaging and analysis of the quality of conductive samples |
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Variable Pressure Mode (VP) High quality imaging and analysis of non-conductive and non sprayed conductive layer samples |
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Extended Pressure Mode (EP) Imaging of water containing or contaminated samples in their natural state |
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Suitable for more users to operate
It is very convenient for both experienced and novice users to operate
In actual laboratory environments, the operation of SEM is usually the exclusive domain of microscopy experts. However, for non expert users, operating SEM becomes challenging, such as students, trainees, or quality engineers, who often also need to obtain data from SEM. EVO considers the needs of both types of users simultaneously, with user interface options that can meet the operational needs of both experienced microscope experts and non professional users.




